Radiation effects and soft errors in integrated circuits...

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Radiation effects and soft errors in...

Radiation effects and soft errors in integrated circuits and electronic devices

Name: Radiation effects and soft errors in integrated circuits and electronic devices
ISBN: 9789812389404

Daniel M. Fleetwood, R. D. Schrimpf

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This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal–oxide–semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Catégories:

Engineering

Année:

2004

Editeur::

World Scientific Pub

Langue:

english

Pages:

297

ISBN 10:

9812389407